Learning from Limited Data in VLSI CAD
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-04666-8_13
Reference31 articles.
1. L.-C. Wang, Experience of data analytics in EDA and test - principles, promises, and challenges. IEEE Trans. CAD 36(6), 885–898 (2017)
2. W. Chen, L.-C. Wang, J. Bhadra, Simulation knowledge extraction and reuse in constrained random processor verification, in ACM/IEEE Design Automation Conference (2013)
3. L.-C. Wang, Data mining in functional test content optimization, in ACM/IEEE Asian South Pacific Design Automation Conference (2015)
4. G. Drmanac, F. Liu, L.-C. Wang, Predicting variability in nanoscale lithography processes, in ACM/IEEE Design Automation Conference (2009)
5. J. Chen, B. Bolin, L.-C. Wang, J. Zeng, D. (Gagi) Drmanac, M. Mateja, Mining AC delay measurements for understanding speed-limiting paths, in IEEE International Test Conference (2010)
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