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Springer International Publishing
Reference20 articles.
1. Y. Wang, P.D. Townsend, Common mistakes in luminescence analysis. J. Phys. Conf. Ser. 398(1), 012003 (2012)
2. Fityk, http://fityk.nieto.pl/
3. L. Skuja, M. Hirano, H. Hosono, K. Kajihara, Defects in oxide glasses. Physica Status Solidi (c) 2(1), 15–24 (2005)
4. S. Nagata, S. Yamamoto, A. Inouye, B. Tsuchiya, K. Toh, T. Shikama, Luminescence characteristics and defect formation in silica glasses under H and HE ion irradiation. J. Nucl. Mater. 367–370(B), 1009–1013 (2007). Proceedings of the Twelfth International Conference on Fusion Reactor Materials (ICFRM-12)
5. A.N. Trukhin, Luminescence of localized states in silicon dioxide glass. A short review. J. Non-Cryst. Solids 357(8–9), 1931–1940 (2011). SiO2, Advanced Dielectrics and Related Devices