Aging Mitigation Techniques for Microprocessors Using Anti-aging Software
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-23781-3_3
Reference10 articles.
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2. Di Carlo, S., Gaudesi, M., Sanchez, E., & SonzaReorda, M. (2014. ISSN 1573-0727). A functional approach for testing the reorder buffer memory. Journal of Electronic Testing, 30(4), 469–481. https://doi.org/10.1007/s10836-014-5461-9 .
3. Barrett, S. F., & Pack, D. J. (2005). Microcontrollers fundamentals for engineers and scientists. Synthesis Lectures on Digital Circuits and Systems, 1(1), 1–124.
4. James FCox. Fundamentals of linear electronics: Integrated and discrete. Cengage Learning,2002.
5. Firouzi, F., Kiamehr, S., & Tahoori, M. B. NBTI mitigation by optimized NOP assignment and insertion. 2012 Design, Automation&Test in Europe Conference & Exhibition (DATE), 218–223. ISSN 15301591. https://doi.org/10.1109/DATE.2012.6176465 .
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