Author:
Redmond Neil,Tran Le-Nam,Choo Kim-Kwang Raymond,Le-Khac Nhien-An
Publisher
Springer International Publishing
Cited by
1 articles.
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1. Finding Forensic Artefacts in Long-Term Frequency Band Occupancy Measurements Using Statistics and Machine Learning;Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering;2024