A Two-Phase Bug Localization Approach Based on Multi-layer Perceptrons and Distributional Features
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-24289-3_38
Reference16 articles.
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3. Kim, D., Tao, Y., Kim, S., Zeller, A.: Where should we fix this bug? a two-phase recommendation model. IEEE Trans. Software Eng. 39(11), 1597–1610 (2013). https://doi.org/10.1109/TSE.2013.24
4. Lam, A.N., Nguyen, A.T., Nguyen, H.A., Nguyen, T.N.: Bug localization with combination of deep learning and information retrieval. In: 2017 IEEE/ACM 25th International Conference on Program Comprehension (ICPC), pp. 218–229, May 2017. https://doi.org/10.1109/ICPC.2017.24
5. Li, J., He, P., Zhu, J., Lyu, M.R.: Software defect prediction via convolutional neural network. In: 2017 IEEE International Conference on Software Quality, Reliability and Security (QRS), pp. 318–328, July 2017. https://doi.org/10.1109/QRS.2017.42
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