Machine Learning Support for Wafer-Level Failure Pattern Analytics

Author:

Wang Li-C.,Zeng Yueling

Publisher

Springer International Publishing

Reference65 articles.

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1. LLM-Assisted Analytics in Semiconductor Test (Invited);Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD;2024-09-09

2. IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat;2023 IEEE International Test Conference (ITC);2023-10-07

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