Author:
Mustafa Yerzhan,Köse Selçuk
Publisher
Springer International Publishing
Cited by
2 articles.
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1. Built-In Self-Test of SFQ Circuits Using Side-Channel Leakage Information;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-06
2. Side-channel Attacks Targeting Classical-Quantum Interface in Quantum Computers;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19