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Springer International Publishing
Reference93 articles.
1. Adar, F., Delhaye, M., Da Silva, E.: Evolution of Instrumentation for Detection of the Raman Effect as Driven by Available Technologies and by Developing Applications, Pittcon Conference, Water Symposium (2003). http://www.horiba.com/fileadmin/uploads/Scientific/Documents/Raman/waters_symposium_pittcon.pdf
2. Anderson, M.S.: Locally enhanced Raman spectroscopy with an atomic force microscope. Appl. Phys. Letts. 76(21), 3130–3132 (2000)
3. Bachelot, R., Gleyzes, P., Boccara, A.C.: Near-field optical microscope based on local perturbation of a diffraction spot. Opt. Lett. 20(18), 1924–1926 (1995)
4. Best, S.P., Clark, R.J.H., Withnall, R.: Non-destructive pigment analysis of artefacts by Raman microscopy. Endeavour. 16(2), 66–73 (1992)
5. Betzig, E., Trautman, J.K., Harris, T.D., Weiner, J.S., Kostelak, R.L.: Breaking the diffraction barrier – optical microscopy on a nanometric scale. Science. 251(5000), 1468–1470 (1991)
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