A Test System Design for JESD204B Transmitter Controller Chip

Author:

Han Xiaodong,Yang Bowen,Wang Xiao,Zhao Huan

Publisher

Springer International Publishing

Reference19 articles.

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3. Liu, Y.J., Xu, Y.X., Huang, Y., Wei, W.: Research and design of automatic test system for small and medium-sized integrated circuits. China New Telecommun. 17(21), 126 (2015)

4. Liao, Y.B., Li, P., et al.: Automatic configuration generation for a SOC Co-verification technology based FPGA functional test system. In: IEEE International Conference on Asic, pp. 605–608. IEEE (2009)

5. Zhu, Y.Y., Fang, J.Y., Quan, X.S.: FPGA verification platform based on VCD waveform. Command Control Simul. 41(5), 121–125 (2019)

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