Mathematical modeling for chemical vapor deposition in a single-wafer reactor: Application to low-pressure deposition of Tungsten

Author:

Park Jung-Hwan

Publisher

Springer Science and Business Media LLC

Subject

General Chemical Engineering,General Chemistry

Reference50 articles.

1. Arora, R. and Pollard, R., “A Mathematical Model for Chemical Vapor Deposition Influenced by Surface Reaction Kinetics: Application to low pressure deposition of tungsten”,J. Electrochem. Soc.,138(5), 1523 (1991).

2. Blewer, R. S. (ed.), “Tungsten and Other Refractory Metals for VLSI Applications”, MRS Publishers, Pittsburg, PA (1986).

3. Blewer, R. S. and McConica, C. M. (eds.), “Tungsten and Other Refractory Metals for VLSI Applications IV”, MRS Publishers, Pittsburg, PA (1989).

4. Broadbent, E. K. (ed.), “Tungsten and Other Refractory Metals for VLSI Applications II”, MRS Publishers, Pittsburg, PA (1987).

5. Broadbent, E. K. and Ramiller, C. L., “Selective Low Pressure Chemical Vapor Deposition of Tungsten”,J. Electrochem. Soc.,131(6), 1427 (1984).

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