Reflectometric method of roughness measurement for polished metal surfaces-Reference-Cited by-同舟云学术

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Reflectometric method of roughness measurement for polished metal surfaces

Published:1984-01 Issue:1 Volume:27 Page:14-17
ISSN:0543-1972
Container-title:Measurement Techniques
language:en
Short-container-title:Meas Tech

Author:

Obradovich K. A.,Popov Yu. V.,Solodukho F. M.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Instrumentation

Link

http://link.springer.com/content/pdf/10.1007/BF01100594.pdf

Reference9 articles.

1. I. J. Hodgkinson, J. Phys. E., Sci. Instrument.,3, 341 (1970).

2. H. E. Bennet, USA Patent No. 3771880 (1973).

3. K. A. Obradovich, Yu. N. Popov, and F. M. Solodukho, Izmer. Tekh., No. 2, 19 (1982).

4. K. A. Obradovich and F. M. Solodukho, Inventor's Certificate No. 815492, Byull. Izobret., No. 11 (1981).

5. F. G. Bass and I. M. Fuks, Wave Scattering at a Statistically Uneven Surface [in Russian], Nauka, Moscow (1972).

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1. Surface-topography assessment: precursor to the prediction of pressed-contact behaviour;Transactions of the Institute of Measurement and Control;1988-09

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