Analysis of laser energy deposition leading to damage and ablation of HfO2 and Nb2O5 single layers submitted to 500 fs pulses at 1030 and 343 nm
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry
Link
http://link.springer.com/content/pdf/10.1007/s00339-016-0197-2.pdf
Reference34 articles.
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4. P. Martin, S. Guizard, Ph Daguzan, G. Petite, P. DOliveira, P. Meynadier, M. Perdrix, Subpicosecond study of carrier trapping dynamics in wide-band-gap crystals. Phys. Rev. B 55, 5799 (1997)
5. I.H. Chowdhury, A.Q. Wu, X. Xu, A.M. Weiner, Ultra-fast laser absorption and ablation dynamics in wide-band-gap dielectrics. Appl. Phys. A 81, 1627 (2005)
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