High-resolution X-ray imaging—a powerful nondestructive technique for applications in semiconductor industry

Author:

Zschech Ehrenfried,Yun Wenbing,Schneider Gerd

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Cited by 46 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Non-destructive Materials Characterization using Ionizing Radiation;Non-destructive Materials Characterization and Evaluation;2023

2. High resolution in non-destructive testing: A review;Journal of Applied Physics;2022-09-14

3. A dual-functional micro-focus X-ray source based on carbon nanotube field emission;Diamond and Related Materials;2022-05

4. “Moore’s Law” of NDE;Handbook of Nondestructive Evaluation 4.0;2022

5. A Transparent Nano-Polycrystalline ZnWO4 Thin-Film Scintillator for High-Resolution X-ray Imaging;ACS Omega;2021-11-22

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