Hardening of multi-component CdZnTeSe solid solutions: a theoretical approach
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry
Link
https://link.springer.com/content/pdf/10.1007/s00339-023-07109-8.pdf
Reference27 articles.
1. P. Fougeres, P. Siffert, M. Hageali, J.M. Koebel, R. Regal, CdTe and Cd1-xZnxTe for nuclear detectors: facts and fictions. Nucl. Instrum. Methods Phys. Res. Sect. A 428, 38–44 (1999). https://doi.org/10.1016/S0168-9002(98)01578-2
2. L. Verger, M. Boitel, M.C. Gentet, R. Hamelin, C. Mestais, F. Mongellaz, J. Rustique, G. Sanchez, Characterization of CdTe and CdZnTe detectors for gamma-ray imaging applications. Nucl. Instrum. Methods Phys. Res. Sect. A 458, 297–309 (2001). https://doi.org/10.1016/S0168-9002(00)00874-3
3. U.N. Roy, G.S. Okobiah Camarda, Y. Cui et al., Growth and characterization of detector grade CdMnTe by the vertical Bridgman technique. AIP Adv. 8, 105012 (2018). https://doi.org/10.1063/1.5040362
4. D. Alam, S.S. Nasim, S. Hasam, Recent progress in CdZnTe based room temperature detectors for nuclear radiation monitoring. Prog. Nuclear Energy 140, 103918 (2021). https://doi.org/10.1016/j.pnucene.2021.103918
5. A. Mycielski, A. Wardak, D. Kochanowska, M. Witkowska-Baran, M. Szot, R. Jakieła et al., CdTe-based crystals with Mg, Se, or Mn as materials for X- and gamma-ray detectors: Selected physical properties. Prog. Crys. Growth. Charact. Mater. 67, 100543 (2021). https://doi.org/10.1016/j.pcrysgrow.2021.100543
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