Crystal structure, morphology, depth profile of elements and mid-infrared optical constants of 'mild' lead telluride film-Reference-Cited by-同舟云学术

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Crystal structure, morphology, depth profile of elements and mid-infrared optical constants of 'mild' lead telluride film

Published:2003-04-01 Issue:6 Volume:76 Page:965-968
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Li B.,Zhang S.,Zhang F.,Zeng L.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s00339-002-1948-9.pdf

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Production of Thin Pb_xSn_1–xTe Films by “Hot Wall” Method for Creating IR-Photodetectors;Science & Technique;2021-12-03

2. Infrared High-Index Coating Materials, PbTe and Pb1−xGexTe: Properties and Applications;Coatings and Thin-Film Technologies;2019-01-03

3. Using lead germanium telluride as a high-index coating material in the mid-wavelength infrared narrow bandpass filters;Chinese Optics Letters;2015

4. The Difference between Microstructures and Optical Properties of Pb_1-xGe_xTe Thin Films Evaporated Using Electron Beam and Resistance Heating Respectively;Advanced Materials Research;2012-06

5. EFFECTS OF POLISHING ON THE PERFORMANCES OF Pb_1-xGe_xTe THIN-FILMS DEPOSITED ON SI SUBSTRATE;JOURNAL OF INFRARED AND MILLIMETER WAVES;2010-01-06

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