An analytical model for the determination of crystallite size and crystal lattice microstrain distributions in nanocrystalline materials from the variance of the X-ray diffraction peaks-Reference-Cited by-同舟云学术

An analytical model for the determination of crystallite size and crystal lattice microstrain distributions in nanocrystalline materials from the variance of the X-ray diffraction peaks

Published:2008-06-28 Issue:1 Volume:94 Page:
ISSN:0947-8396
Container-title:Applied Physics A
language:en
Short-container-title:Appl. Phys. A

Author:

Sánchez-Bajo F.,Ortiz A. L.,Cumbrera F. L.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s00339-008-4732-7.pdf

Reference21 articles.

1. H.P. Klug, L.E. Alexander, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials (Wiley, New York, 1974)

2. B.E. Warren, X-ray Diffraction (Dover, New York, 1990)

3. B.E. Warren, B.L. Averbach, J. Appl. Phys. 21, 595 (1950)

4. A.R. Stokes, A.J.C. Wilson, Proc. Camb. Philos. Soc. 38, 313 (1942)

5. W.L. Smith, J. Appl. Crystallogr. 9, 189 (1976)

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