Physical processes in a super-tip gas field ion source
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry
Link
http://link.springer.com/content/pdf/10.1007/s00339-003-2218-1.pdf
Reference12 articles.
1. K. Jousten, K. Böhringer, R. Börret, S. Kalbitzer: Ultramicroscopy 26, 301 (1988)
2. Th. Miller, A. Knoblauch, S. Kalbitzer: Appl. Phys. A 61, 99 (1995)
3. A. Knoblauch, Th. Miller, Ch. Klatt, S. Kalbitzer: Nucl. Instrum. Methods B 139, 20 (1998)
4. Th. Miller, A. Knoblauch, S. Kalbitzer: In Proc. Int. Symp. Materials Science Applications of Ion Beam Techniques, ed. by A.G. Balogh, G. Walter (Trans Tech Publications Ltd., Uetikon-Zürich, Switzerland 1997) pp. 433–438
5. T.T. Tsong: In Atom-probe Field Ion Microscopy (Cambridge University Press, Cambridge 1990) Chapt. 2
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