Light-triggered defect dynamics in silicon wafers: understanding degradation mechanisms-Reference-Cited by-同舟云学术

Light-triggered defect dynamics in silicon wafers: understanding degradation mechanisms

Published:2024-05 Issue:5 Volume:130 Page:
ISSN:0947-8396
Container-title:Applied Physics A
language:en
Short-container-title:Appl. Phys. A

Author:

Chibane Yougherta^ORCID,Kouhlane Yacine,Bouhafs Djoudi,Achour Wafa,Mohammed-Krarroubi Asmaa,Khelfane Amar

Funder

Direction Générale de la Recherche Scientifique et du Développement Technologique

Publisher

Springer Science and Business Media LLC

Link

https://link.springer.com/content/pdf/10.1007/s00339-024-07511-w.pdf

Reference88 articles.

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3. D. Chen, Elucidating the mechanics behind light- and elevated temperature-induced degradation in silicon solar cells. Thesis, UNSW, Sydney, (2020) https://doi.org/10.13140/RG.2.2.10653.33762

4. Y. Zhongshu, J. Krügener, F. Feldmann, J.-I. Polzin, B. Steinhauser, T. Le, D. Macdonald, A. Liu, Impurity gettering in polycrystalline-silicon based passivating contacts—the role of oxide stoichiometry and pinholes. Adv. Energy Mater. 12, 2103773 (2022). https://doi.org/10.1002/aenm.202103773

5. L.I. Khirunenko, M.G. Sosnin, A.V. Duvanskii, N.V. Abrosimov, H. Riemann, New properties of boron–oxygen dimer defect in boron-doped Czochralski silicon. J. Appl. Phys. 132(13), 135703 (2022). https://doi.org/10.1063/5.0114809