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Evidence by spectroscopic ellipsometry of optical property change in pulsed laser deposited NiO films when heated in air at Neel temperature

  • Published:2004-09 Issue:4-6 Volume:79 Page:1439-1443
  • ISSN:0947-8396
  • Container-title:Applied Physics A
  • language:en
  • Short-container-title:Appl. Phys. A

Author:

Dahoo P.R.,Hamon T.,Negulescu B.,Rocher P.,Tessier M.,Wack A.,Thomas L.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Reference16 articles.

1. H. Ofner, F. Zaera: J. Chem. Phys. 101, 9069 (1997)

2. B. Negulescu: PhD dissertation, University of Versailles St Quentin en Yvelines (2003)

3. A.S. Foster: PhD dissertation, University College of London (2000)

4. T. Hamon: Graduate Trainee course report, Laboratory of Magnetism and Optics of Versailles (2002)

5. P.R. Dahoo, A. Girard, Y. Dumond, M. Tessier, M. Guyot, N. Keller: (MS 5719, COLA’03 proceedings)

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1. References;Applications and Metrology at Nanometer Scale 2;2021-04-15

2. Non-destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices;Embedded Mechatronic Systems;2019

3. Synthesis, Characterization, and Applications of Three-Dimensional (3D) Nanostructures;Synthesis and Applications of Inorganic Nanostructures;2017-09-22

4. Bibliography;Nanometer-Scale Defect Detection Using Polarized Light;2016-09-16

5. Degradation of Structure of Magnetron Ni and Cr Nanofilms at their Heating on Air;Journal of Nano- and Electronic Physics;2016
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