Properties of bilayer contacts to porous silicon-Reference-Cited by-同舟云学术

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Properties of bilayer contacts to porous silicon

Published:2012-03-15 Issue:2 Volume:107 Page:293-300
ISSN:0947-8396
Container-title:Applied Physics A
language:en
Short-container-title:Appl. Phys. A

Author:

Gallach D.,Torres-Costa V.,García-Pelayo L.,Climent-Font A.,Martín-Palma R. J.,Barreiros-das-Santos M.,Sporer C.,Samitier J.,Manso M.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s00339-012-6851-4.pdf

Reference35 articles.

1. V. Torres-Costa, R.J. Martin-Palma, J. Mater. Sci. 45(11), 2823 (2010)

2. R.S. Dubey, D.K. Gautam, Opt. Quantum Electron. 41(3), 189 (2009)

3. D. Gallach, G. Recio Sanchez, A. Munoz Noval, M. Manso Silvan, G. Ceccone, R.J. Martin Palma, V. Torres Costa, J.M. Martinez Duart, Mater. Sci. Eng., B, Solid-State Mater. Adv. Technol. 169(1–3, SI), 123 (2010)

4. G. Recio-Sanchez, M. Manso, V. Torres-Costa, D. Gallach, R.J. Martin-Palma, Sensor Lett. 8(3, SI), 387 (2010)

5. K. Ziouche, P. Godts, Z. Bougrioua, C. Sion, T. Lasri, D. Leclercq, Sens. Actuators A, Phys. 164(1–2), 35 (2010)

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1. Near ambient pressure X-ray photoelectron spectroscopy monitoring of the surface immobilization cascade on a porous silicon-gold nanoparticle FET biosensor;Applied Surface Science;2019-10

2. Ohmic and Rectifying Contacts to Porous Silicon;Handbook of Porous Silicon;2018

3. Electrical Characterization Techniques for Porous Silicon;Handbook of Porous Silicon;2018

4. Electrical Characterization Techniques for Porous Silicon;Handbook of Porous Silicon;2016

5. Ohmic and Rectifying Contacts to Porous Silicon;Handbook of Porous Silicon;2014

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