Effects of TiN intermediate layer on microstructure and magnetic anisotropy of FePt thin films
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry
Link
http://link.springer.com/content/pdf/10.1007/s00339-016-9890-4.pdf
Reference24 articles.
1. J.S. Chen, B.C. Lim, J.F. Hu, Y.K. Lim, B. Liu, G.M. Chow, High coercivity L10 FePt films with perpendicular anisotropy deposited on glass substrate at reduced temperature. Appl. Phys. Lett. 90, 042508 (2007)
2. Y. Xia, H. Fan, W. Liu, The effect of annealing treatment on microstructure and properties of TiN films prepared by unbalanced magnetron sputtering. J. Alloys Compd. 496, 695–698 (2010)
3. K.F. Dong, H.H. Li, Y.G. Peng, G. Ju, G.M. Chow, J.S. Chen, Nanocomposite L10 FePt–SiNx and FePt–SiNx–C films with large coercivity and small grain size on a TiN intermediatelayer. J. Magn. Magn. Mater. 324, 2637–2644 (2012)
4. H.H. Li, K.F. Dong, Y.G. Peng, G. Ju, G.M. Chow, J.S. Chen, High coercive FePt and FePt–SiNx(001) films with small grain size and narrow opening-up of in-plane hysteresis loop by TiN intermediate layer. J. Appl. Phys. 110(4), 043911 (2011)
5. Isao Matsui, Takashi Ogi, Ferry Iskandar, Kikuo Okuyama, Perpendicular easy axis alignment of FePt nanoparticles on a platinum-(001) buffer layer for high-density magnetic recording. J. Appl. Phys. 110, 083906 (2011)
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