Coupling of Electron Channeling with EBSD: Toward the Quantitative Characterization of Deformation Structures in the SEM

Author:

Gutierrez-Urrutia I.,Zaefferer S.,Raabe D.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Materials Science

Reference56 articles.

1. D.B. Williams and C.B. Carter, Transmission Electron Microscopy. A Textbook for Materials Science (New York: Springer, 2009).

2. G. Thomas and M.J. Goringe, Transmission Electron Microscopy of Materials (New York: Wiley, 1979).

3. P. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley, and M.J. Whelan, Electron Microscopy of Thin Crystals (Huntington: Robert E. Krieger, 1977).

4. J. Ayache, L. Beaunier, J. Boumendil, G. Ehret, and D. Laub, Sample Preparation Handbook for Transmission Electron Microscopy (New York: Springer, 2009).

5. H. Mughrabi, Phil. Mag. 23, 869 (1971).

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