Radiative Properties of Thin Films of Common Dielectric Materials in the IR Spectral Range of 1.5–14.2 μm: Application to Infrared Imaging-Reference-Cited by-同舟云学术

Radiative Properties of Thin Films of Common Dielectric Materials in the IR Spectral Range of 1.5–14.2 μm: Application to Infrared Imaging

Published:2018-05-10 Issue:7 Volume:70 Page:1267-1273
ISSN:1047-4838
Container-title:JOM
language:en
Short-container-title:JOM

Author:

Bañobre Asahel,Marthi Sita Rajyalaxmi,Ravindra N. M.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Materials Science

Link

http://link.springer.com/article/10.1007/s11837-018-2883-3/fulltext.html

Reference16 articles.

1. N.M. Ravindra, S.R. Marthi, and A. Bañobre, Radiative Properties of Materials (Bristol: Institute of Physics/Morgan & Claypool Publishers, 2017), pp. X–Xiii.

2. C. Lamsal and N.M. Ravindra, Emerg. Mater. Res. 3, 194 (2014).

3. A. Bañobre and N.M. Ravindra, Proceedings of MS&T 2016 (Salt Lake City).

4. N.M. Ravindra, D.E. Pierce, G. Guazzoni, M. Babladi, and O.H. Gokce, Proceedings of the 10th Workshop on Crystalline Silicon Solar Cell Materials and Processes (Copper Mountain, CO, August 2000), pp. 174–81.

5. N.M. Ravindra, W. Tong, W. Schmidt, and M.A. Tello, Proceedings of ISSM 1996 (Tokyo, 2–4 October 1996).

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