Electron Backscatter Diffraction: An Important Tool for Analyses of Structure–Property Relationships in Thin-Film Solar Cells-Reference-Cited by-同舟云学术

Electron Backscatter Diffraction: An Important Tool for Analyses of Structure–Property Relationships in Thin-Film Solar Cells

Published:2013-07-17 Issue:9 Volume:65 Page:1222-1228
ISSN:1047-4838
Container-title:JOM
language:en
Short-container-title:JOM

Author:

Abou-Ras D.,Kavalakkatt J.,Nichterwitz M.,Schäfer N.,Harndt S.,Wilkinson A. J.,Tsyrulin K.,Schulz H.,Bauer F.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/s11837-013-0685-1.pdf

Reference35 articles.

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3. T.K. Todorov, J. Tang, S. Bag, O. Gunawan, T. Gokmen, Y. Zhu, and D.B. Mitzi, Adv. Energy Mater. 3, 34 (2012).

4. New World Record Efficiency for Thin Film Silicon Solar Cells (Lausanne: EPFL, 2013), http://actu.epfl.ch/news/new-world-record-efficiency-for-thin-film-silicon-/ . Accessed 15 April 2013.

5. J. Poortmans and V. Arkhipov, eds., Thin Film Solar Cells: Fabrication, Characterization, and Applications, 1st ed. (Chichester: Wiley, 2006).

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