Computed tomography part II: The practical use of a single source and detector-Reference-Cited by-同舟云学术

Computed tomography part II: The practical use of a single source and detector

Published:1994-03 Issue:3 Volume:46 Page:11-19
ISSN:1047-4838
Container-title:JOM
language:en
Short-container-title:JOM

Author:

Elliott James C.,Anderson Paul,Davis Graham Roy,Leng Wong Ferranti See,Dover S. David

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF03220641.pdf

Reference34 articles.

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3. R. Nußhardt et al., “Microtomography: A Tool for Nonde-structive Study of materials,” Synchrotron Radiation News, 4 (1991),pp.21–23.

4. J.H. Kinney and M.C. Nichols, “X-Ray Tomographie Microscopy (XMT) Using Synchrotron Radiation,” Annual Rev. Sci., 22 (1992), pp. 121–152.

5. J.C. Elliott and S.D. Dover, “X-Ray Microtomography,” /. Microscopy, 126 (1982), pp. 211–213.

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