Author:
Fukuda Mitsuo,Ikegami Tetsuhiko
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference11 articles.
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5. Ikegami (T.), Takahei (K.), Fukuda (M.), Kuroiwa (K.). Stress tests on 1.3 μm buried-heterostructure laser diode.Electron. Lett. (1983),19, pp. 282–283.
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