Applications of neutron activation to microelectronic materials research at the Cornell TRIGA reactor-Reference-Cited by-同舟云学术

Applications of neutron activation to microelectronic materials research at the Cornell TRIGA reactor

Published:1995-04 Issue:1 Volume:192 Page:65-72
ISSN:0236-5731
Container-title:Journal of Radioanalytical and Nuclear Chemistry Articles
language:en
Short-container-title:Journal of Radioanalytical and Nuclear Chemistry, Articles

Author:

McGuire S. C.,Hossain T. Z.,Golkowski C.,Kerness N. D.,Sulcer J. D.

Publisher

Springer Science and Business Media LLC

Subject

Health, Toxicology and Mutagenesis,Public Health, Environmental and Occupational Health,Spectroscopy,Pollution,Radiology Nuclear Medicine and imaging,Nuclear Energy and Engineering,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF02037737.pdf

Reference17 articles.

1. D. K. SCHRODER, Semiconductor Material and Device Characterization, John Wiley & Sons, (1990) 561.

2. R. M. LINDSTROM, in Microelectronic Processing: Inorganic Material Characterization, L. A. CASPER, Ed., Am. Chem. Soc. Symp. series295, (1986) 294.

3. E. W. HASS and R. HOFMANN, Solid-State Electron., 30 (1987) 329.

4. Z. B. ALFASSI and M. H. YANG, in Activation Analysis. Vol.II, Z. B. ALFASSI, Ed., CRC Press, Boca Raton, Florida, (1990) 579.

5. Cornell University Nuclear Reactor Laboratory Report, CURL-1, (1961) 1.

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