The study of temperature coefficient of resistivity of polycrystalline metal films
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/BF01111888.pdf
Reference24 articles.
1. K. Fuchs,Proc. Camb. Phil. Soc. 34 (1938) 100.
2. E. H. Sondheimer,Adv. Phys. 1 (1952) 1.
3. D. S. Campbell, ?The Use of Thin Film in Physical Investigations? (Academic, New York, 1968) p. 311.
4. A. F. Mayadas andM. Shatzkes,Phys. Rev. B 1 (1970) 1382.
5. A. K. Pal andP. Sen,J. Mater. Sci. 12 (1977) 1472.
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