Object and defect detection in additive manufacturing using deep learning algorithms
Author:
Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s11740-024-01278-y.pdf
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5. Chen Li-Fei, Chao-Ton Su, Chen Meng-Heng (2009) A neural-network approach for defect recognition in TFT-LCD photolithography process. IEEE Trans Electron Packaging Manuf 32(1):1–8
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