Selecting measurements to test the functional behavior of analog circuits-Reference-Cited by-同舟云学术

Selecting measurements to test the functional behavior of analog circuits

Published:1996-08 Issue:1-2 Volume:9 Page:9-18
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Van Spaandonk J.,Kevenaar T. A. M.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00137561.pdf

Reference24 articles.

1. J.L. Huertas, ?Test and Design for Testability of Analog and Mixed-Signal Integrated Circuits: Theoretical Basis and Pragmatical Approaches?, Proc. ECCTD'93, 1993, pp. 77?156.

2. W. Hochwald and J.D. Bastian, ?A DC Approach for Analog Fault Determination?, IEEE Trans. Circ. and Syst., Vol. 26, pp. 523?529, July 1979.

3. R. Saeks, S.P. Singh, and R. Liu, ?Fault Isolation via Components Simulation?, IEEE Trans. Circ. Theory, Vol. 19, pp. 634?640, Nov. 1972.

4. A.T. Johnson, ?Efficient Fault Analysis in Linear Analog Circuits?, IEEE Trans. Circ. & Syst., Vol. 26, pp. 475?484, July 1979.

5. N. Navid and A.N. Willson, ?A Theory and Algorithm for Analog Circuit Fault Diagnosis?, IEEE Trans. Circ. & Syst., Vol. 26, pp. 440?457, July 1979.

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