Metrology in physics and chemistry-Reference-Cited by-同舟云学术

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Metrology in physics and chemistry

Published:2000-05-04 Issue:5 Volume:5 Page:206-207
ISSN:0949-1775
Container-title:Accreditation and Quality Assurance
language:
Short-container-title:Accreditation and Quality Assurance

Author:

Valcárcel Miguel,Rios A.

Publisher

Springer Science and Business Media LLC

Subject

Safety, Risk, Reliability and Quality,Instrumentation,General Chemical Engineering,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s007690050445.pdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analytical metrology for nanomaterials: Present achievements and future challenges;Analytica Chimica Acta;2019-06

2. Analytical chemistry at the interface between metrology and problem solving;TrAC Trends in Analytical Chemistry;2004-09

3. Introduction to the proceedings of the International Conference on Metrology – Trends and Applications in Calibration and Testing Laboratories, 16–18 May 2000, Jerusalem, Israel;Accreditation and Quality Assurance;2001-02-08

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