Characterizing the microstructure of interfaces in Y-123 thin films-Reference-Cited by-同舟云学术

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Characterizing the microstructure of interfaces in Y-123 thin films

Published:1995-03 Issue:3 Volume:47 Page:43-46
ISSN:1047-4838
Container-title:JOM
language:en
Short-container-title:JOM

Author:

Marshall Ann F.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF03221435.pdf

Reference21 articles.

1. D. Dimos, P. Chaudhari, and J. Mannhart, Phys. Rev. B, 41 (1990), p. 4038.

2. S.W. Chan, et al., AIP Conf. Proc., No. 200, High Tc Superconducting Thin Films, ed. R. Stockbaur (New York: Am. Inst. Phys., 1990), p. 172.

3. S.E. Babcock et al., Nature, 347 (1990), p. 167.

4. C.B. Eom et. al, Nature, 353 (1991) p. 544.

5. S. Jin et al., Appl. Phys. Lett., 52 (1988), p. 2074.

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Magneto-optical study of flux penetration and critical current densities in [001] tiltYBa2Cu3O7−δthin-film bicrystals;Physical Review B;1996-04-01

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