Elemental depth profile analysis of hard coatings of tungsten carbide by auger electron (AES-) microprobe/sputtering-Reference-Cited by-同舟云学术

Elemental depth profile analysis of hard coatings of tungsten carbide by auger electron (AES-) microprobe/sputtering

Published:1986-01 Issue:2 Volume:324 Page:111-119
ISSN:0016-1152
Container-title:Fresenius' Zeitschrift für analytische Chemie
language:en
Short-container-title:Z. Anal. Chem.

Author:

Garten Rainer P. H.

Publisher

Springer Science and Business Media LLC

Subject

Clinical Biochemistry,General Materials Science,General Medicine,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00473349.pdf

Reference77 articles.

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3. Fischmeister H (ed) (1980) Surface problems in materials science and technology; Mat Sci Eng, vol 42. Elsevier, Lausanne

4. Stingeder G, Wilhartitz P, Schreiner M, Grasserbauer M (1984) Fresenius Z Anal Chem 319:787–794

5. Viefhaus H, Peters J, Grabke HJ (1984) Fresenius Z Anal Chem 319:595–596 and (1986) Surface Interface Anal, to be published

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