Utilization of the vertical divergence of a beam of X-rays in a two-crystal spectrometer in X-ray spectroscopy-Reference-Cited by-同舟云学术

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Utilization of the vertical divergence of a beam of X-rays in a two-crystal spectrometer in X-ray spectroscopy

Published:1968-04 Issue:4 Volume:18 Page:532-537
ISSN:0011-4626
Container-title:Czechoslovak Journal of Physics
language:en
Short-container-title:Czech J Phys

Author:

Hrdý J.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF01698217.pdf

Reference2 articles.

1. Drahokoupil J., Fingerland A.: Collection of Papers from the Conference “Röntgenspektren und chemische Bindung”. Institute of Physical Chemistry, Karl Marx University, Leipzig 1966, p. 90.

2. Compton A. H., Allison S. K.: X-ray in Theory and Experiment. Van Nostrand, New York 1935.

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