Author:
Sheen Jyh,Li Chueh-Yu,Ji Liang-Wen,Mao Wei-Lung,Liu Weihsing,Chen Chin-An
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference34 articles.
1. H.I. Chien, P.Kr. Petrov, V.R. Palkar, A.K. Tagantsev, K. Prashanthi, A.K. Axelsson, S. Bhattacharya, N.M. Alford, Microwave characterisation of La- and Dy- doped BiFeO3 thin films. 6th IEEE international symposium on applications of ferroelectrics, ISAF, 27–31 May 2007, pp. 380–382
2. J. Krupka, W.T. Huang, M.J. Tung, Complex permittivity measurements of thin ferroelectric films employing split post dielectric resonator. 11th international meeting on ferroelectricity, Foz do Iguacu, Brazil, 5–9 Sept 2005
3. J. Obrzut, R. Nozaki, TDR permittivity measurements of dielectric films. IMTC 2006—Instrumentation and measurement technology conference, Sorrento, Italy 24–27 April 2006, pp. 1816–1819
4. M.D. Janezic, J.H. Grosvenor, Improved technique for measuring permittivity of thin dielectrics with a cylindrical resonator cavity. IMTC 1991—instrumentation and measurement technology conference, 14–16 May 1991, pp. 580–584
5. E.K. Akdogan, W.K. Simon, A. Safari, Paraelectric thin films by nanoscale engineering of epitaxy and planar anisotropy for microwave phase shifter applications. IEEE Trans. Ultrason. Ferroelectr. Freq. Control 53(12), 2323–2332 (2006)
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