Preparation and characterization of ZnS nanocrystalline thin films by low cost dip technique-Reference-Cited by-同舟云学术

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Preparation and characterization of ZnS nanocrystalline thin films by low cost dip technique

Published:2014-03-11 Issue:5 Volume:25 Page:2017-2023
ISSN:0957-4522
Container-title:Journal of Materials Science: Materials in Electronics
language:en
Short-container-title:J Mater Sci: Mater Electron

Author:

Farid Huda,Abdel Rafea M.,El-Wahidy E. F.,El-Shazly O.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s10854-014-1790-9.pdf

Reference29 articles.

1. A. Goktas, F. Aslan, E. Yasar, I.H. Mutlu, J. Mater. Sci. Mater. Electron. 23(7), 1361–1366 (2012)

2. C. Ma, D. Moore, J. Li, Z.L. Wang, Adv. Mater. 228, 15 (2003)

3. E. Monroy, F. Omnes, F. Calle, Semicond. Sci. Technol. 33, 18 (2003)

4. S. Velumani, J.A. Ascencio, Appl. Phys. A Mater. Sci. Process. 236, 72 (2003)

5. H. Chander, V. Shanker, D. Haranath, S. Dudeja, P. Sharma, Mater. Res. Bull. Thin Solid Films 279, 38 (2003)

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