1. P. Ferreira, R.A. Bianchi, F. Guyader, R. Pantel, E. Granger, in Proceedings of the 31st European Solid-state Device Research Conference (Nuremberg, Germany, 2001)
2. M.L. Polignano, G.P. Carnevale, P. Fantini, I. Mica, Electrochem. Soc. Meeting Trans. 3, 199 (2006)
3. D. Peschiaroli, M. Brambilla, G.P. Carnevale, F. Cazzaniga, C. Clementi, C. Cremonesi, A. Gilardini, M. Martinelli, A. Maurelli, I. Mica, A. Pavan, G. Pavia, F. Piazza, M.L. Polignano, E. Bonera, Proceedings of the Electrochemical Society Spring Meeting (Paris, France, 2003), p. 477
4. G. Servalli, D. Brazzelli, E. Camerlenghi, G. Capetti, S. Costantini, C. Cupeta, D. De Simone, A. Ghetti, T. Ghilardi, P. Gulli, M. Mariani, A. Pavan, R. Somaschini, Proceedings of the International Electron Device Meeting 2005 (IEEE, Piscataway NJ, 2006)
5. I. Mica, M.L. Polignano, O. Moreau, D. Codegoni, P. Prestini, P. Magni, International Conference on Extended Defects in Semiconductors (EDS 2006), (Halle, Germany, September 2006)