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Structural, magnetic and electrical transport properties of Sm0.43Nd0.10Sr0.47MnO3 thin film by DC-magnetron sputtering

  • Published:2016-01-30 Issue:5 Volume:27 Page:5114-5120
  • ISSN:0957-4522
  • Container-title:Journal of Materials Science: Materials in Electronics
  • language:en
  • Short-container-title:J Mater Sci: Mater Electron

Author:

Ramkumar S.,Rajarajan G.,Singh H. K.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. V. Agarwal, R. Prasad, M.P. Singh, P.K. Siwach, A. Srivastava, P. Fournier, H.K. Singh, Appl. Phys. Lett. (2010). doi: 10.1063/1.3302455

2. R.P. Borges, W. Guichard, J.G. Lunney, J.M.D. Coey, F. Ott, J. Appl. Phys. (2001). doi: 10.1063/1.1331658

3. E. Breckenfeld (2014) Growth-induced non-stoichiometry in complex oxide Systems. Ph.D Dissertation, University of Illinois at Urbana-Champaign

4. M. Egilmez, K.H. Chow, J. Jung, Z. Salman, Appl. Phys. Lett. (2007). doi: 10.1063/1.2724906

5. M. Egilmez, R. Patterson, K.H. Chow, J. Jung, Appl. Phys. Lett. (2007). doi: 10.1063/1.2746956

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