1. Newman, R.C., Claybourn, M., Kinder, S.H., Messoloras, S., Oates, A.S., Stewart, R.J.: Semiconductor Silicon 1986, Huff, H.R., Abe, T., Kolbesen, B. (eds.), Pennington, N.J.: Electrochem. Soc. 1986, p. 766.
2. Binnig, G., Rohrer, H.: Ultramicroscopy 11 (1983) 157.
3. Teague, E.C.: Proc. 46th Annual Meeting EMSA, GW Bailey (ed.), San Francisco: San Francisco Press, CA 1988, p. 1004.
4. Kdira, K., Hashizume, H., Yoshimura, J.C.: Jpn. J. Appl. Phys. 9 (1970) 1029.
5. Schmahl, G., Rudolf, D., Niemann, B.: Phys. Bl. 38 (1982) 283.