ICP-AES detection of silicon carbide impurities volatilized in a graphite furnace with the use of carbon tetrachloride vapour-Reference-Cited by-同舟云学术

ICP-AES detection of silicon carbide impurities volatilized in a graphite furnace with the use of carbon tetrachloride vapour

Published:1992-05 Issue:3-6 Volume:107 Page:345-358
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Z�ray Gyula,K�ntor Tibor,Wolff Gerhard,Zadgorska Zdravka,Nickel Hubertus

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01244490.pdf

Reference32 articles.

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