Stress in the components of a thin film silicon monoxide capacitor and its relationship to dielectric loss
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/BF00550213.pdf
Reference33 articles.
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4. M. A. Novice, Brit. J. Appl. Phys. 13 (1962) 561.
5. Idem, Vacuum 14 (1964) 385.
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