Micromachined Pyroelectric Probe for Non-Contact Thermal Diagnostic Systems-Reference-Cited by-同舟云学术

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Micromachined Pyroelectric Probe for Non-Contact Thermal Diagnostic Systems

Published:2013 Issue:2 Volume:7 Page:95-102
ISSN:1881-3054
Container-title:Journal of Advanced Mechanical Design, Systems, and Manufacturing
language:en
Short-container-title:JAMDSM

Author:

SUITA Kenji¹,HARA Motoaki¹,ISHIKAWA Shinya¹,TANAKA Katsuhiro¹,NAGASAWA Sumito¹,KUWANO Hiroki¹

Affiliation:

1. Department of Nanomechanics Graduate School of Engineering, Tohoku University

Publisher

Japan Society of Mechanical Engineers

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Link

https://www.jstage.jst.go.jp/article/jamdsm/7/2/7_95/_pdf

Reference23 articles.

1. (1) Black. J, Electromigration-a brief survey and some recent results, IEEE Trans. Electron Devices, 16 (1969) pp.338-347.

2. (2) Tu. K, Recent advances on electromigration in very-large-scale- integration of interconnects, J. Appl. Phys., 94, 9 (2003), pp.5451-5473.

3. (3) Williams. C, and Wickramasinghe. H, Scanning thermal profiler, Appl. Phys. Lett., vol. 49, 23 (1986), pp.1587-1589.

4. (4) Majundar. A, Carrejo. J, and Lai. J, Thermal imaging using the atomic force microscope, Appl. Phys. Lett., 62, 20 (1993), pp.2501-2503.

5. (5) Majundar. A, Thermal microscopy and heat generation in electronic devices, Microelectronics Reliability, 38 (1998), pp.559-565.

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