Damage of single-wall carbon nanotube network structure under electric current loading

Author:

SATO Shunsuke1,FUJISAKI Kazuhiro1,SASAGAWA Kazuhiko1

Affiliation:

1. Department of Intelligent Machines and System Engineering, Hirosaki University

Publisher

Japan Society of Mechanical Engineers

Subject

General Medicine

Reference18 articles.

1. Begtrup, G. E., Gannett, W., Yuzvinsky, T. D., Crespi, V. H. and Zettl, A., Nanoscale reversible mass transport for archival memory, Nano Letters, Vol. 9, No. 5, (2009), pp. 1835-1838.

2. Begtrup, G. E., Ray, K. G., Kessler B. M., Yuzvinsky, T. D., Garcia, H. and Zettl, A., Extreme thermal stability of carbon nanotubes, Physica Status Solidi (b), Vol. 244, (2007), pp. 3960-3963.

3. Berber, S., Kwon, Y. K. and Tomanek, D., Unusually high thermal conductivity of carbon nanotubes, Physical Review Letters, Vol. 84, No. 20, (2006), pp. 240-250.

4. Collins, P. G., Arnold, M. S. and Avouris, P., Engineering carbon nanotubes and nanotube circuits using electrical breakdown, Science, Vol. 292, (2001), pp. 706-709.

5. Dijon, J., Fournier, A., Szkutnik, P. D., Okuno, H., Jayet, C. and Fayolle, M., Carbon nanotubes for interconnects in future integrated circuits, The challenge of the density, diamond and related materials, Vol. 19, (2010), pp. 382-388.

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