TFT-LCD Mura Defect Detection Using Wavelet and Cosine Transforms

Author:

CHEN Shang-Liang1,CHOU Shang-Ta1

Affiliation:

1. National Chen-Kung University, Institute of Manufacturing Engineering

Publisher

Japan Society of Mechanical Engineers

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference14 articles.

1. [1] W. K. Pratt, S. S. Sawkar, and K. O'Reilly, “Automatic blemish detection in liquid crystal flat panel displays,” IS&T/SPIE Symposium on Electronic Imaging: Science and Technology, 1998.

2. Quantitative evaluation of “mura” in liquid crystal displays

3. [3] Y.-H. Tseng, “Automatic Surface Inspection for TFT-LCD Array Panels Using Fourier Reconstruction,” in Department of Industrial Engineering and Management. vol. Master: Yuan Ze University, 2003.

4. [4] C.-C. Kuo, “Development of Automatic TFT-LCD Mura Defect Detection,”in Institute of Automation Technology. vol. Master: National Taipei University of Technology, 2006.

5. Characterization of Single and Multiple Scatter From Matter and Activity Distributions Outside the FOV in 3-D PET

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