TFT-LCD Mura Defect Detection Using Wavelet and Cosine Transforms
Author:
Affiliation:
1. National Chen-Kung University, Institute of Manufacturing Engineering
Publisher
Japan Society of Mechanical Engineers
Subject
Industrial and Manufacturing Engineering,Mechanical Engineering
Link
http://www.jstage.jst.go.jp/article/jamdsm/2/3/2_3_441/_pdf
Reference14 articles.
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2. Quantitative evaluation of “mura” in liquid crystal displays
3. [3] Y.-H. Tseng, “Automatic Surface Inspection for TFT-LCD Array Panels Using Fourier Reconstruction,” in Department of Industrial Engineering and Management. vol. Master: Yuan Ze University, 2003.
4. [4] C.-C. Kuo, “Development of Automatic TFT-LCD Mura Defect Detection,”in Institute of Automation Technology. vol. Master: National Taipei University of Technology, 2006.
5. Characterization of Single and Multiple Scatter From Matter and Activity Distributions Outside the FOV in 3-D PET
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