Hygrothermal Cracking Analysis of Plastic IC Package
Author:
Affiliation:
1. Hyundai Motor Company, 772-1, Jangduk-dong, Whasung-si, Gyunggi-do, 445-706, Korea (Republic)
2. Department of Mechanical Engineering, Yonsei University SinchonDong, SeodaemoonGu, Seoul 120-749, Korea
Abstract
Publisher
ASME International
Subject
Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials
Link
http://asmedigitalcollection.asme.org/electronicpackaging/article-pdf/127/2/164/5678055/164_1.pdf
Reference18 articles.
1. A Stress Singularity Parameter Approach for Evaluating the Interfacial Reliability of Plastic Encapsulated LSI Devices;Hattori;ASME J. Electron. Packag.
2. New Mode Crack of LSI Package in the Solder Reflow Process;Adachi;IEEE Trans. Compon., Hybrids, Manuf. Technol.
3. Structural Integrity Evaluation for a Plastic Package during the Soldering Process;Kawamura
4. Thermal and Structural Analysis of a PLCC Device for Surface Mount Process;Glaser;ASME J. Electron. Packag.
5. Combined Moisture and Thermal Stresses Failure Mode in a PLCC;Kornblum;ASME J. Electron. Packag.
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1. Anisotropic hygrothermal fracture mechanics in orthotropic materials: A novel efficient interpolating modified MLS-based EFGM employing radial basis function;Composite Structures;2024-04
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