Development of Compact Models for Electronics Cooling: Using the Multigrid Operator to Generate Reduced-Order Description of Devices

Author:

Sathyamurthy Prabhu1,Nagulapally Manoj1,Nair Rajesh1

Affiliation:

1. Fluent Inc., 10 Cavendish Court, Lebanon, NH 03766

Abstract

The need for compact models for ICs is a well-recognized problem in electronics cooling simulations of systems containing multiple PCBs and many devices per board. The disparate length scales inherent in the problem and the necessity of resolving these size scales render the computational problem intractable. Many resistance-capacitance (RC) network compact models have been proposed in the literature. We present a methodology to automatically construct both the topology and characteristics of the reduced-order or compact models of devices [primarily Integrated Circuit (IC) packages] for use in system-level simulations using the multigrid operator. The multigrid technique has been extensively used over the past 20 years to accelerate the solution of linear systems. In addition to automatically generating both the RC network topology and its values, the procedure is general enough to be applicable for complex IC device types (such as multichip modules), stack-up dies, distributed sources on the die, DC-DC converters, and devices such as hard disk drives.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference17 articles.

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3. Lasance, C. J. M., 1997, “Thermal Characterization of Electronic Parts With Compact Models: Interpretation, Application, and The Need for a Paradigm Shift,” Proc. of 13th IEEE SEMITHERM Symposium, IEEE, New York, pp. 40–48.

4. Lasance, C. J. M., Vinke, H., and Rosten, H., 1995, “Thermal Characterization of Electronic Devices With Boundary Condition Independent Compact Models,” IEEE Trans. Compon., Packag. Manuf. Technol., Part A, 18, pp. 723–731.

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