Dependence of Nano-Friction and Nano-Wear on Loading Force for Sharp Diamond Tips Sliding on Si, Mn-Zn Ferrite, and Au
Author:
Jiang Zhaoguo1, Lu C.-J.1, Bogy D. B.1, Miyamoto T.2
Affiliation:
1. Computer Mechanics Laboratory, Department of Mechanical Engineering, University of California at Berkeley, Berkeley, CA 94720 2. Kaneko Research Laboratory, NTT Interdisciplinary Research Laboratories, 9-11, Midori-Cho 3-Chome, Musashino-Shi, Tokyo 180, Japan
Abstract
Microscopic friction and wear were measured on both the original top surfaces and freshly worn surfaces of three solid materials including a silicon wafer, a Mn-Zn ferrite block and an Au film, using a recently developed scanning probe microscope with sharp diamond tips. A critical point was observed on the friction versus normal loading force curve. The critical point divides the friction curve into two distinct regimes: a low friction regime in which the friction coefficients are from 0.03–0.06, and a high friction regime where the friction coefficients are between 0.12 and 0.38 depending on the materials tested and the tips. The critical loads at the critical points are different for different materials and different tips. But the average pressures corresponding to the critical points calculated by the Hertz elastic contact theory for different tips are close to each other for the same material. The freshly worn surfaces have tribological behaviors similar to those of the corresponding original top surfaces. Below the critical load no wear is detectable, whereas above the critical load wear is obtained with the wear depth proportional to the load. The implications are that a no-wear sliding condition is possible, for example in contact recording systems, if the asperity contact loads all remain less than the critical value for the particular sliding system.
Publisher
ASME International
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanical Engineering,Mechanics of Materials
Reference12 articles.
1. Ashby, M. F., and Jones, D. R. H., 1980, Engineering Materials: an Introduction to Their Properties and Applications, 1st ed., Oxford, Pergamon Press, New York. 2. Binning
G.
, QualeC. F., and GerberCh., 1986, “Atomic Force Microscope,” Physics Review Letters, Vol. 56, No. 9, pp. 930–933. 3. Germann
G. J.
, CohenS. R., NeubauerG., and McClellandG. M., 1993, “Atomic Scale Friction of a Diamond Tip on Diamond (100) and (111) Surfaces,” J. Appl. Phys., Vol. 73, No. 2, pp. 163–167. 4. Hamilton
R.
, AndersonR., and GoodsonK., 1991, “Contact Perpendicular Recording on Rigid Media,” IEEE Trans. Magn., Vol. 27, No. 6, pp. 4921–4926. 5. Kaneko
R.
, MiyamotoT., and HamadaE., 1991, “Development of a Controlled Friction Force Microscope and Imaging of Recording Disk Surfaces,” Adv. Info. Storage Syst., Vol. 1, pp. 267–277.
Cited by
24 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
|
|