Thermoplastic Finite Element Analysis of Unfilled Plated-Through Holes During Wave Soldering

Author:

Fu Chia-Yu1,McDowell David L.2,Ume I. Charles2

Affiliation:

1. Solid State Research Center, Motorola Labs, 7700 S. River Pkwy, Tempe, AZ 85284

2. George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332

Abstract

Previous related research has not developed a consensus on the issue of how stress analyses of plated-through hole (PTH)/printed wiring board (PWB) structure subject to uniform temperature change can approximate the fully transient case. In this study, these two types of analyses are conducted using McDowell’s thermoplastic model with previously developed numerical implementation by applying a finite element package and an associated user-defined material subroutine. The same wave soldering temperature profile is used. The detailed stress/strain responses of the copper layer, along the heating and cooling of the wave soldering process, are compared at both the PTH corner and barrel portions. The temperature distributions and corresponding deformations of the model are also reported for the fully transient thermal and one-way coupled mechanical analysis. It is concluded that despite the transient thermal loading, the residual stress and strain distributions within the PTH/PWB structure after cooling can be adequately approximated using the more simple analysis which prescribes a uniform temperature and temperature change at each stage of the process.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Fu, C., McDowell, D. L., and Ume, C., 1996, “Thermo-Mechanical Stress Analyses of Plated Through Holes in A PWB Using Internal State Variable Constitutive Models,” Proc. Symposium on Sensing, Modeling and Simulation in Emerging Electronic Packaging Interconnects, ASME WAM, Atlanta, GA.

2. Oien, M. A., 1976, “Methods for Evaluting Plated Through Hole Reliability,” Proc. of IEEE 14th annual Rel. Phys. Symposium, pp. 129–131.

3. Nankey, R, W. , 1976, “Thermally Induced Strains in Plated Through Holes in Multilayer Circuit Boards,” IPC, Lincolnwood, IL, Tech. Rep. IPC-TP-121, pp. 1–23.

4. Vecchio, K. S., and Hertzberg, R. W., 1986, “Analysis of Long Term Reliability of Plated-Through Holes in Multilayer Interconnection Boards-Part A: Stress Analysis and Material Characterization,” Microelectron. Reliab., 26, No. 4, pp. 715–732.

5. Iannuzelli, R. J., 1991, “Predicting Plated-Through-Hole Reliability in High Temperature Manufacturing Processes,” Proc. IEEE 41st ECTC, pp. 410–421.

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