Variable Frequency Microwave Processing of Underfill Encapsulants for Flip-Chip Applications

Author:

Mead Patricia F.1,Ramamoorthy Aravind1,Pal Shapna1,Fathi Z.2,Ahmad I.3

Affiliation:

1. CALCE Electronic Products and Systems Center, University of Maryland, College Park, MD 20742

2. Lambda Technologies Inc. Morrisville, NC 27560

3. Lambda Technologies, Inc., Morrisville, NC 27560

Abstract

This paper discusses an innovative technique for rapid cure of polymeric encapsulants such as underfills used in direct chip attach devices using variable frequency microwaves (VFM). VFM processing reduces the cure time for underfill encapsulants to 10 min or less, as compared to 30 or more minutes when using convection oven methods. We report here the results of our investigations measuring key material attributes of VFM and conventionally cured underfill encapsulant samples, and we also have characterized voiding and delamination characteristics of flip-chip with underfill test structures. Finally, particle settling in the flip-chip with underfill test structures has been characterized. Our results show that the VFM technique produces underfill attributes that are comparable to conventionally cured samples.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference34 articles.

1. Anderson, B., Ahmad, I., Tucker, D., Goldstein, S., Fathi, Z., Ramamoorthy, A., Pal, S., and Mead, P., 1998, “Rapid Processing and Properties Evaluation of Flip-Chip Underfills,” Proc., Technical Program NEPCON West ’98 Conference, Vol. 3, Anaheim, CA, pp. 1043–1051.

2. Copson, D., 1962, Microwave Heating: In Freeze Drying, Electronic Ovens and Other Applications, Avi Publishing Company, Westport, CN.

3. Ramamoorthy, A., and Mead, P. F. 1999, “Investigation of variable frequency microwaves for cure of flip chip underfills,” Proceedings of InterPACK ’99: Pacific RIM/ASME International Intersociety Electronics Photonic Packaging Conference ’Advances in Electronic Packaging 1999, Maui, HI, ASME EEP-26 (2), pp. 1569–1572.

4. Mead, P. F., and Broadwater, K., 2000, “In-Fiber Strain Characterization of Fiber Optic Connector Assemeblies Via Bragg Grating Sensors,” Appl. Opt., 39(28), pp. 5101–5108.

5. Fathi, Z., Tucker, D. A., Wei, B. J., Garard, R. S., Mead, P. F., Balaji, P. and Hutchins, C. L. 1997. “Rapid cure of liquid encapsulants and structural adhesives for electronics packaging using variable frequency microwave (VFM) energy,” Proc., Electronic Packaging Materials Science IX Symposium, Boston, eds., S. K. Groothuis, P. S. Ho, K. Ishida, and T. Wu, pp. 125–130.

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