1. 1) For example, Proc. of Int. Symp. on Behavior of Lattice Imperfections in Materials-In Situ Experiments with HVEM, Osaka Univ., 1986.
2. 2) For example, Electron Microscopy of Thin Crystals, edited by P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley and M. J. Whelan, Butterworths, London, 1965.
3. 3) H. Fujita, Y. Kawasaki, E. Furubayashi, S. Kajiwara and T. Taoka: Jpn., J. Appl. Phys., 6 (1967), 214.
4. 4) H. Fujita: J. Electr. Microsc., 3 (1986), 243.
5. 5) C. J. Humphrey, L. E. Thomas, J. S. Lally and R. M. Fisher: Phil. Mag., 23 (1971), 87.